Silicon Carbide Single-Wafer Epitaxy Furnace SCML320A

Silicon Carbide Single-Wafer Epitaxy Furnace SCML320A

Parameter Item

Technical Indicators

Device Model

SCML320A

Device dimensions

4650*1450*2690mm

Growth rate

≥60 µm/h

Background concentration

≤1E+14 cm +3

Film thickness growth

1–100 μm

Temperature control accuracy

±0.1℃

Defect

<0.2 cm -2

Doping uniformity

<2.0%

Film thickness uniformity

<1.0%

Roughness

<0.2 nm


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No. 49, Zonghui Road, Nanjing Economic and Technological Development Zone


sales@cgee.com.cn

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+86-025-86660150

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